作者：Mourad
出版社：模擬．其他
出版日期：台灣 
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A pragmatic approach to testing electronic systemsAs we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is appliedto random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:* An explanation of where a test belongs in the design flow* Detailed discussion of scan-path and ordering of scan-chains* BIST solutions for embedded logic and memory blocks* Test methodologies for FPGAs* A chapter on testing system on a chip* Numerous references
*以上商品說明取材於博客來網路書店, 應以博客來網路書店內容為準
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出版社：模擬．其他
出版日期：台灣
按我瀏覽更多相關資訊
A pragmatic approach to testing electronic systemsAs we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is appliedto random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:* An explanation of where a test belongs in the design flow* Detailed discussion of scan-path and ordering of scan-chains* BIST solutions for embedded logic and memory blocks* Test methodologies for FPGAs* A chapter on testing system on a chip* Numerous references
*以上商品說明取材於博客來網路書店, 應以博客來網路書店內容為準
有更多商品在EZ網路書店等你來!!
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